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Noise study of a high-Tc Josephson junction under near-millimeter-wave irradiation

机译:近毫米波辐射下高约瑟夫森结的噪声研究

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摘要

Noise studies of both the dc and ac Josephson effects have been performed on a high‐Tc ramp‐type Josephson junction irradiated at 176 GHz. Well‐established analytical results for noise in overdamped RSJs are used to model the measured I‐V characteristics, and their agreement is excellent. Noise‐rounded I‐V curves at the critical current and the first and second Shapiro steps under coherent 176 GHz radiation have been studied in detail at several temperatures and rf power levels. The noise temperatures inferred from these simulations are close to the physical temperatures. An increase of noise temperatures at high radiation power levels is a result of radiation heating, which could be due to a bolometric effect.
机译:直流和交流约瑟夫森效应的噪声研究都是在176 GHz辐射的高Tc斜坡型约瑟夫森结上进行的。完善的过阻尼RSJ噪声分析结果可用于对测得的I-V特性进行建模,其一致性非常好。在几个温度和射频功率水平下,已经详细研究了在关键电流以及相干176 GHz辐射下第一和第二次Shapiro步骤的噪声舍入后的I-V曲线。从这些模拟推断出的噪声温度接近物理温度。高辐射功率水平下噪声温度的升高是辐射加热的结果,这可能是由于辐射热效应。

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